Automatic Detection and Explanation of Dark Patterns from Interface Microcopy: Empirical Comparison of BERT-Style Encoders, RoBERTa-Style Encoders, and LLM-Style Decoders on the ec-darkpattern Dataset
Xu, et al. (2025). Automatic Detection and Explanation of Dark Patterns from Interface Microcopy: Empirical Comparison of BERT-Style Encoders, RoBERTa-Style Encoders, and LLM-Style Decoders on the ec-darkpattern Dataset. Journal of Technology Informatics and Engineering, 4(3). https://doi.org/10.51903/jtie.v4i3.491
Xu, Haosen ; Chen, Yushan ; Med, Aron , "Automatic Detection and Explanation of Dark Patterns from Interface Microcopy: Empirical Comparison of BERT-Style Encoders, RoBERTa-Style Encoders, and LLM-Style Decoders on the ec-darkpattern Dataset," Journal of Technology Informatics and Engineering, vol. 4, no. 3, 2025.
Xu, Haosen ; Chen, Yushan ; Med, Aron . "Automatic Detection and Explanation of Dark Patterns from Interface Microcopy: Empirical Comparison of BERT-Style Encoders, RoBERTa-Style Encoders, and LLM-Style Decoders on the ec-darkpattern Dataset." Journal of Technology Informatics and Engineering, vol. 4, no. 3, 2025.
Xu, Haosen ; Chen, Yushan ; Med, Aron . "Automatic Detection and Explanation of Dark Patterns from Interface Microcopy: Empirical Comparison of BERT-Style Encoders, RoBERTa-Style Encoders, and LLM-Style Decoders on the ec-darkpattern Dataset." Journal of Technology Informatics and Engineering 4, no. 3 (2025).
Xu, et al. (2025) 'Automatic Detection and Explanation of Dark Patterns from Interface Microcopy: Empirical Comparison of BERT-Style Encoders, RoBERTa-Style Encoders, and LLM-Style Decoders on the ec-darkpattern Dataset', Journal of Technology Informatics and Engineering, 4(3). doi: 10.51903/jtie.v4i3.491.
Xu, Haosen ; Chen, Yushan ; Med, Aron . Automatic Detection and Explanation of Dark Patterns from Interface Microcopy: Empirical Comparison of BERT-Style Encoders, RoBERTa-Style Encoders, and LLM-Style Decoders on the ec-darkpattern Dataset. Journal of Technology Informatics and Engineering. 2025;4(3).
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